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Laboratorio
16
Transmission Electron Microscopy (TEM)
Apparecchiature presenti
Transmission Electron Microscope JEOL JEM F-200 operante a 200 kV con una risoluzione di 2.3Å
Partnerships
The newly acquired TEM allows the characterization of a wide range of samples, covering all the research topics within the Institute.
Personale coinvolto
Senior researcher
Senior researcher
Researcher
Senior researcher
Researcher
