Study and characterization of surface and bulk materials
Laboratorio di analisi chimica e cristallochimica per lo studio dei materiali in superficie ed in bulk mediante tecniche di spettroscopia e diffratometria basate sull’interazione della materia con radiazioni ionizanti X
Apparecchiature presenti
High-resolution X-ray diffractometer (XRD) with power of 3KW, model DAVINCI seri-II Bruker, equipped with monochromatic Cu source for X-ray generation;
X-ray Fluorescence Spectrophotometer (XRF) with power of 4KW, model TIGER seri-II, with wavelength dispersive detector and Rh lamp X-ray source;
X-ray electron photoemission spectrophotometer (XPS) with a maximum power of 400W, model Physical Electronics PHI GMBH 5800-0, equipped with dual-anod Al and Al-Mg X-ray source, monochromator, TOF hemispheric analyzer, ion-gun, in-situ treatment reactor